SEM imaging and microanalysis
Our SEM is an advanced Scanning Electron Microscope with an EDS that provides incredible accuracy, resolution and data. With its tungsten emitter, it can handle any sample with ease.
Hitachi SU3800 – Scanning Electron Microscope & EDS
SU3800 is an all-in-one scanning electron microscope, offering a complete range of imaging and analysis capabilities. With its tungsten emitter, it can be used in both high and low vacuum modes, giving you access to all the data you need.
- SEM with Tungsten Filament
- High Vac and Low Vac
- Acc. Voltage: <0.3 to 30KV continuous
- Resolution: 3.0 nm @ 30KV, WD 5 mm in high vacuum
- Secondary Electron Imaging detector – ETD
- Back Scattered Electron Imaging Detector – BSED
- Low Vacuum Imaging Detector- UVD
- EDS with 136 eV Resolution and Mapping
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Stage: 5-axis motorized
• X = 0-100 mm
• Y= 0 to 50 mm
• Z = 5-65 mm
• Rotation 360°
